超微切片的基本原理

English | 2024 | ISBN: 9819747902 | 246 pages | True PDF,EPUB | 44.57 MB

This book commences with an introduction to the fundamental principles of light and electron microscopy, laying the groundwork for readers to grasp the significance of ultramicrotomy within these fields. It addresses every aspect of ultramicrotomy, including its history, instrumentation, procedural intricacies, as well as guidelines for maintenance and troubleshooting. A number of images and illustrations have been included to depict every step of the ultramicrotomy procedure to facilitate deeper understanding of the subject. It also talks about different techniques that can be employed for enhancing the quality and precision of the microscopy results.

This book is a resource for researchers, faculty members, students, microtomists and microscopists working on sample preparation and analysis through transmission electron microscopy.

这本书以光电子显微镜的基本原则介绍开始，为读者奠定基础，理解超薄切片在这些领域中的重要性。它涵盖了超薄切片的所有方面，包括其历史、仪器、操作细节以及维护和故障排除指南。书中包含了许多图片和插图来展示整个超薄切片过程的每一个步骤，以帮助加深对这个主题的理解。此外，还讨论了可以用于提高显微镜结果的质量和精确度的不同技术。 这本书是从事透射电子显微镜样本准备与分析的研究人员、教师、学生、超薄切片师和显微学家们的资源。

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