单事件效应，从太空到加速器环境

English | 2024 | ISBN: 978-3-031-71723-9 | 141 Pages | PDF EPUB (True) | 42 MB

Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels

描述电子系统中辐射效应的基础概念以及当前最先进的硬化方法 涵盖被称为单粒子效应（SEE）的失效机制，以及专门的失效建模和预测方法 揭示了物理布局和电路层面的辐射硬设计（RHBD）新技术

---

Download from free file storage

 Download from nitroflare.com  Download from rapidgator.net

---

我要反馈

---

本站不对文件进行储存，仅提供文件链接，请自行下载，本站不对文件内容负责，请自行判断文件是否安全，如发现文件有侵权行为，请联系管理员删除。