VLSI电路中跨层延迟故障的生成测试

English | PDF,EPUB | 2018 (2019 Edition) | 161 Pages | ISBN : 9811324921 | 4.33 MB

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

这本书描述了用于测试VLSI电路串扰延迟故障的各种生成测试算法。它向读者介绍了各种串扰效应，并描述了基于确定性方法和仿真方法来检测串扰延迟故障的方法。本书首先关注目前可用的串扰延迟模型、用于延迟能力和串扰延迟故障的生成测试算法，然后转向用于检测串扰延迟故障的确定性和基于仿真的算法。鉴于其覆盖范围之广，这本书对VLSI测试领域的设计工程师和研究人员具有吸引力。

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